Machines Free Full-Text Mask-Guided Generation Method for Industrial Defect Images with Non-uniform Structures

The independent controls of the normal backgrounds, defect shapes, and defect textures are rarely considered. If independent control and operation of the three are achieved, then they can be arbitrarily combined to obtain an infinite number of defective images from a normal image. However, current effective methods such as SDGAN , Defect-GAN , and SIGAN control the three as a whole and can only obtain one defect image from a normal image based on well-trained models, whose randomness and diversity are insufficient. Moreover, the pixel-level annotations of the generated defect images can be acquired if we separately process the normal backgrounds and defect regions. To verify the advantages of MDGAN over other methods, CycleGANs were trained on the above datasets. To help CycleGAN retain the normal background, we added a L1 loss between the input and output to the original losses .

Figure 1.An example of a defect sample with non-uniform structures. He, K.; Zhang, X.; Ren, S.; Sun, J. Deep residual learning for image recognition. In Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition , Las Vegas, NV, USA, 27–30 June 2016; pp. 770–778. Zhu, J.-Y.; Park, T.; Isola, P.; Efros, A.A. Unpaired image-to-image translation using cycle-consistent adversarial networks. In Proceedings of the IEEE International Conference on Computer Vision, Venice, Italy, 22–29 October 2017; pp. 2223–2232.

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Image data augmentation mainly includes traditional and learning-based methods. Traditional methods can increase the number of samples, but cannot create new defect samples. Based on cutting-edge work in image synthesis , industrial image generation can be carried out, to achieve the augmentation of few-sample datasets.

When there is an issue or defect in one page, it prevents the team to move from that page to another. This further inhibits the team from identifying defects in other pages. Let’s imagine that an application is able to print a document either by laser printer or by dot matrix printer. To reach this, the application first searches for the laser printer. In this case if it finds a laser printer it uses this one and prints.

Translations of defect

Methods based on machine learning and deep learning have remarkably improved industrial defect detection performance . However, practical industrial scenarios pose challenges to the current detection methods, such as data problems. Acquiring large datasets for manufacturing applications remains a challenging proposition, due to the time and costs involved . The small number of defect samples and data imbalances can lead to overfitting during the training of supervised deep-learning methods and poor performance in testing .

definition of defect masking

As our article ondeep learning explains, deep learning is a subset of machine learning. The primary difference between machine learning and deep learning is how each algorithm learns and how much data each type of algorithm uses. That is, the networks could not inherit and generate the real defects without DDM. However, there are still some challenges that need to be addressed in the current learning-based defect image augmentation methods.

Examples of defect

In case if it does not find a laser printer, the application searches for dot matrix printer. And if the application finds a dot matrix printer, it gives an error message. Masked defect is one that exists but does not cause failure due to another bug/error that is also present and this error prohibited that piece of the code from being executed. Construction defect reporting using mobile and digital workbench technologies.

definition of defect masking

MDGAN was used to synthesize defect images based on the above datasets. Except for the metal nut and capsule, which involved three-channel color images, the images consisted of single-channel grayscale images. Section 4.2 shows the generated quality, diversity, and annotation accuracy of MDGAN. We also compare MDGAN with the most commonly used CycleGAN in Section 4.5, to certify the effectiveness of our methods. Then we assess the advantages of our synthetic samples over traditional augmented results.

CdZnTe (CZT) Wafer

To tackle these challenges, we proposed a MDGAN (mask-guided defect generation adversarial network) based on CGAN . The MDGAN can generate realistic defects in regions specified by the input binary mask. First, we introduce a BRM to extract normal backgrounds using a binary mask to replace the contents at the corresponding positions in the feature maps.

  • Consider this example, suppose there is a link to add employee on a portal.
  • Textures provide important and unique information for intelligent visual detection and identification systems .
  • Some defects are caused by improper processing, others by insufficent control in environment and still others by improper imaging.
  • Many manufacturers have begun slowly investing in fully automated inspection systems that enable consistent and objective inspections.
  • But as the search of the dot matrix printer fails, the print dot matrix printer error is never detected.

Artificial intelligence, the broadest term of the three, is used to classify machines that mimic human intelligence and human cognitive functions like problem-solving and learning. AI uses predictions and automation to optimize and solve complex tasks that humans have historically done, such as facial and speech recognition, decision making and translation. Of these, 67 had a common atrioventricular orifice („complete“ https://www.globalcloudteam.com/ defect) while the remaining 73 had separate orifices for the right and left junctions („partial“ defects). For subjects of both rank types, the higher the expectation of defection, the higher the probability of defecting. They are already used frequently in structural analysis, for example to detect micro- or nanoscale defects. Some of the mayor’s long-time supporters have defected to other candidates.

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Data management is more than merely building the models you’ll use for your business. You’ll need a place to store your data and mechanisms for cleaning it and controlling for bias before you can start building anything. Deep learning automates much of the feature extraction piece of the process, eliminating some of the manual human intervention required. It also enables the use of large data sets, earning the title of scalable machine learning. That capability is exciting as we explore the use of unstructured data further, particularly sinceover 80% of an organization’s data is estimated to be unstructured. For example, let’s say I showed you a series of images of different types of fast food—“pizza,” “burger” and “taco.” A human expert working on those images would determine the characteristics distinguishing each picture as a specific fast food type.

Our DDM focuses on the defect region and the whole image simultaneously, ensuring the quality of the generated results. MVTec-AD is a commonly used public dataset in industrial vision tasks. MVTec-test contains multiple classes of defect images with pixel-level annotations, and MVTec-train contains many normal images. Therefore, we employed what is defect masking MVTec-AD to construct the training and testing sets of MDGAN. Where λr, λd, λg, and λgp control the contribution of each loss to the whole. Based on the trained MDGAN, inputting the normal background and the binary mask to the generator, the output is the synthesized defect image whose pixel-level annotation is the binary mask.

IBM, machine learning and artificial intelligence

As long as the defect textures are similar, the resource consumption for recollecting and labeling datasets can be greatly reduced by MDGAN, which is highly valuable for intelligent manufacturing. We employed two methods to obtain binary masks to construct the rich MDGAN test sets. First, MVTec-AD provided many binary masks of defect samples, which characterized the shapes of industrial defects and could be cropped as inputs for MDGAN.

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